Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero. Feature Selection for Cost Reduction In MCU Performance Screening. In 24th IEEE Latin American Test Symposium, LATS 2023, Veracruz, Mexico, March 21-24, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.