Abstract is missing.
- Feature Selection for Cost Reduction In MCU Performance ScreeningNicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero. 1-6 [doi]
- Effect of Vth shifting in CMOS Transistors under radiation conditions when applying OBT: A case studyPablo A. Petrashin, Walter J. Lancioni, Agustin Laprovitta, Fortunato Dualibe, Juan Luis Castagnola. 1-4 [doi]
- Co-optimization of security and accessibility to on-chip instrumentsErik Larsson. 1-2 [doi]
- Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing"Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre. 1-2 [doi]
- Analyzing Side-Channel Attack Vulnerabilities at RTLXinhui Lai, Maksim Jenihhin. 1-2 [doi]
- Invited Paper: A Holistic Fault Injection Platform for Neuromorphic HardwareFelix Staudigl, Thorben Fetz, Rebecca Pelke, Dominik Sisejkovic, Jan Moritz Joseph, Letícia Maria Veiras Bolzani Poehls, Rainer Leupers. 1-6 [doi]
- A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault InjectionsG. Govarini, Annachiara Ruospo, Edgar E. Sánchez. 1-6 [doi]
- SSSN: Secured Streaming Scan NetworkSonali Shukla, Bhavika Ranjeet Kumar, Virendra Singh. 1-6 [doi]
- Fault Tolerant Architecture Design of a CubeSat Command and Data Handling SystemChristo A. Lara, Maximiliano Fragoso, Luis Manuel Juárez, Leonardo Barboni, Rigoberto Reyes, Ricardo Vázquez, Julio Pérez Acle, Saúl de la Rosa. 1-6 [doi]
- A Fault Injection Framework for AI Hardware AcceleratorsSalvatore Pappalardo, Annachiara Ruospo, Ian O'Connor, Bastien Deveautour, Ernesto Sánchez 0001, Alberto Bosio. 1-6 [doi]
- Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron ChecksChandramouli N. Amarnath, Abhijit Chatterjee. 1-2 [doi]
- Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioningEsther Goudet, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche. 1-6 [doi]
- Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequenciesManasa Madhvaraj, Salvador Mir, Manuel J. Barragán. 1-2 [doi]
- A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic GatesVíctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli. 1-6 [doi]
- Holistic IJTAG-based External and Internal Fault Monitoring in UAVsFoisal Ahmed, Maksim Jenihhin. 1-6 [doi]
- Evaluating a New RRAM Manufacturing Test StrategyThiago Santos Copetti, A. Castelnuovo, Tobias Gemmeke, Letícia Maria Veiras Bolzani. 1-6 [doi]
- Silent Error Corruption: The New Reliability and Test ChallengeAdit D. Singh. 1-2 [doi]
- LUT-based Arithmetic Circuit Approximation with Formal Guarantee on Worst Case Relative ErrorPooja Choudhary, Lava Bhargava, Masahiro Fujita, Virendra Singh. 1-2 [doi]
- Blockchain Applied In Decentralization of Ground Stations To Educational NanosatellitesEdilson Filho, Jarbas Silveira, César A. M. Marcon. 1-5 [doi]
- Test Aspects of System Health State MonitoringHans-Joachim Wunderlich, Hanieh Jafarzadeh, Alexandra Kourfali, Natalia Lylina, Zahra Paria Najafi-Haghi. 1-2 [doi]
- Abstractions for Modeling the Effects of Wall Surface Roughness in Silicon Photonic Microring ResonatorsPratishtha Agnihotri, Lawrence M. Schlitt, Priyank Kalla, Steve Blair. 1-6 [doi]
- Special Session: A high-frequency sinusoidal signal generation using harmonic cancellationAnkush Mamgain, Salvador Mir, Jai Narayan Tripathi, Manuel J. Barragán. 1-2 [doi]
- On the integration and hardening of Software Test Libraries in Real-Time Operating SystemsFrancesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre. 1-6 [doi]
- Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization testsPaolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga. 1-2 [doi]
- Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUsJosie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda. 1-6 [doi]