Low Power Testing by Test Vector Ordering with Vector Repetition - researchr publication authors

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Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos, Xrysovalantis Kavousianos. Low Power Testing by Test Vector Ordering with Vector Repetition. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 205-210, IEEE Computer Society, 2004. [doi]

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