Lorenzo Benatti, Paolo Pavan, Francesco Maria Puglisi. Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 6-1, IEEE, 2022. [doi]
Abstract is missing.