Lorenzo Benatti, Sara Vecchi, Milan Pesic, Francesco Maria Puglisi. The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.