Fabio Benevenuti, Fernanda Lima Kastensmidt. Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{BenevenutiK19,
title = {Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs},
author = {Fabio Benevenuti and Fernanda Lima Kastensmidt},
year = {2019},
doi = {10.1109/LATW.2019.8704647},
url = {https://doi.org/10.1109/LATW.2019.8704647},
researchr = {https://researchr.org/publication/BenevenutiK19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1756-0},
}