Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs - researchr publication related

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Fabio Benevenuti, Fernanda Lima Kastensmidt. Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-6, IEEE, 2019. [doi]

The following publications are possibly variants of this publication:

Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection MethodsFabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech. sbcci 2018: 1-6 [doi]

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