Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto. ATPG for Dynamic Burn-In Test in Full-Scan Circuits. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 75-82, IEEE, 2006. [doi]
Abstract is missing.