Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch. Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 39-46, IEEE Computer Society, 2003. [doi]
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