Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs - researchr publication authors

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Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer. Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electronic Testing, 27(5):599-609, 2011. [doi]

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