Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer. Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electronic Testing, 27(5):599-609, 2011. [doi]

Abstract

Abstract is missing.