Disturbance-free BIST for loop characterization of DC-DC buck converters - researchr publication authors

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Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev. Disturbance-free BIST for loop characterization of DC-DC buck converters. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

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