Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev. Disturbance-free BIST for loop characterization of DC-DC buck converters. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{BeoharBRMAVBO15,
title = {Disturbance-free BIST for loop characterization of DC-DC buck converters},
author = {Navankur Beohar and Priyanka Bakliwal and Sidhanto Roy and Debashis Mandal and Philippe Adell and Bert Vermeire and Bertan Bakkaloglu and Sule Ozev},
year = {2015},
doi = {10.1109/VTS.2015.7116250},
url = {http://dx.doi.org/10.1109/VTS.2015.7116250},
researchr = {https://researchr.org/publication/BeoharBRMAVBO15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}