Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism - researchr publication authors

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Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens. Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 21-26, IEEE Computer Society, 2008. [doi]

This author has not been identified. Look up 'Ardy van den Berg' in GoogleThis author has not been identified. Look up 'Pengwei Ren' in GoogleThis author has not been identified. Look up 'Erik Jan Marinissen' in GoogleThis author has not been identified. It may be one of the following persons:

Georgi Gaydadjiev

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