Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens. Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 21-26, IEEE Computer Society, 2008. [doi]
@inproceedings{BergRMGG08,
title = {Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism},
author = {Ardy van den Berg and Pengwei Ren and Erik Jan Marinissen and Georgi Gaydadjiev and Kees Goossens},
year = {2008},
doi = {10.1109/ETS.2008.34},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.34},
tags = {testing, analysis, reuse},
researchr = {https://researchr.org/publication/BergRMGG08},
cites = {0},
citedby = {0},
pages = {21-26},
booktitle = {13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3150-2},
}