Estimation of SiC JFET temperature during short-circuit operations

Mounira Berkani, Stéphane Lefebvre, Narjes Boughrara, Zoubir Khatir, Jean-Claude Faugières, Peter Friedrichs, Ali Haddouche. Estimation of SiC JFET temperature during short-circuit operations. Microelectronics Reliability, 49(9-11):1358-1362, 2009. [doi]

Authors

Mounira Berkani

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Stéphane Lefebvre

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Narjes Boughrara

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Zoubir Khatir

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Jean-Claude Faugières

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Peter Friedrichs

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Ali Haddouche

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