Mounira Berkani, Stéphane Lefebvre, Narjes Boughrara, Zoubir Khatir, Jean-Claude Faugières, Peter Friedrichs, Ali Haddouche. Estimation of SiC JFET temperature during short-circuit operations. Microelectronics Reliability, 49(9-11):1358-1362, 2009. [doi]
Abstract is missing.