Mounira Berkani, Stéphane Lefebvre, Narjes Boughrara, Zoubir Khatir, Jean-Claude Faugières, Peter Friedrichs, Ali Haddouche. Estimation of SiC JFET temperature during short-circuit operations. Microelectronics Reliability, 49(9-11):1358-1362, 2009. [doi]
@article{BerkaniLBKFFH09,
title = {Estimation of SiC JFET temperature during short-circuit operations},
author = {Mounira Berkani and Stéphane Lefebvre and Narjes Boughrara and Zoubir Khatir and Jean-Claude Faugières and Peter Friedrichs and Ali Haddouche},
year = {2009},
doi = {10.1016/j.microrel.2009.06.024},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.024},
researchr = {https://researchr.org/publication/BerkaniLBKFFH09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1358-1362},
}