Efficient orthonormality testing for synthesis with pass-transistor selectors

Michel R. C. M. Berkelaar, Lukas P. P. P. van Ginneken. Efficient orthonormality testing for synthesis with pass-transistor selectors. In Richard L. Rudell, editor, Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995. pages 256-263, IEEE Computer Society, 1995. [doi]

Abstract

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