Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature

Sebastien Bernard, Marc Belleville, Alexandre Valentian, Jean-Didier Legat, David Bol. Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature. In 24th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS), Palma de Mallorca, Spain, September 29 - Oct. 1, 2014. pages 1-7, IEEE, 2014. [doi]

Abstract

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