Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang. A programmable BIST for DRAM testing and diagnosis. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 447-456, IEEE, 2010. [doi]
Abstract is missing.