A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Paolo Bernardi, Giorgio Insinga, Nima Kolahimahmoudi. A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. In 31st IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Dubai, United Arab Emirates, October 16-18, 2023. pages 1-6, IEEE, 2023. [doi]

This author has not been identified. Look up 'Paolo Bernardi' in GoogleThis author has not been identified. Look up 'Giorgio Insinga' in GoogleThis author has not been identified. Look up 'Nima Kolahimahmoudi' in Google

runs on WebDSL