Paolo Bernardi, Giorgio Insinga, Nima Kolahimahmoudi. A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. In 31st IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Dubai, United Arab Emirates, October 16-18, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.