José Luis Bernier, Juan J. Merelo Guervós, Julio Ortega, Alberto Prieto. Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms. In José Mira, Francisco Sandoval Hernández, editors, From Natural to Artificial Neural Computation, International Workshop on Artificial Neural Networks, IWANN 95, Malaga-Torremolinos, Spain, June 7-9, 1995, Proceedings. Volume 930 of Lecture Notes in Computer Science, pages 838-844, Springer, 1995.
Abstract is missing.