Stefano Bertazzoni, Gian-Carlo Cardarilli, D. Piergentili, Marcello Salmeri, Adelio Salsano, Domenico Di Giovenale, G. C. Grande, P. Marinucci, S. Sperandei, S. Bartalucci, G. Mazzenga, M. Ricci, V. Bidoli, D. de Francesco, P. G. Picozza, A. Rovelli. Failure Tests on 64 Mb SDRAM in Radiation Environment. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 158-164, IEEE Computer Society, 1999. [doi]
Abstract is missing.