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Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy

F. Berthet, Y. Guhel, H. Gualous, B. Boudart, J. L. Trolet, M. Piccione, C. Gaquière. Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. Microelectronics Reliability, 51(9-11):1796-1800, 2011. [doi]

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F. Berthet

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Y. Guhel

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H. Gualous

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B. Boudart

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J. L. Trolet

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M. Piccione

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C. Gaquière

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