F. Berthet, Y. Guhel, H. Gualous, B. Boudart, J. L. Trolet, M. Piccione, C. Gaquière. Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. Microelectronics Reliability, 51(9-11):1796-1800, 2011. [doi]
@article{BerthetGGBTPG11,
title = {Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy},
author = {F. Berthet and Y. Guhel and H. Gualous and B. Boudart and J. L. Trolet and M. Piccione and C. Gaquière},
year = {2011},
doi = {10.1016/j.microrel.2011.07.022},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.022},
researchr = {https://researchr.org/publication/BerthetGGBTPG11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1796-1800},
}