Automatic Test Data Generation for XML Schema-based Partition Testing

Antonia Bertolino, Jinghua Gao, Eda Marchetti, Andrea Polini. Automatic Test Data Generation for XML Schema-based Partition Testing. In Hong Zhu, W. Eric Wong, Amit M. Paradkar, editors, Proceedings of the Second International Workshop on Automation of Software Test, AST 2007, Minneapolis, MN, USA, May 26-26, 2007. pages 10-16, IEEE, 2007. [doi]

Abstract

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