Yves Bertrand, Frédéric Bancel, Michel Renovell. Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 989-997, IEEE Computer Society, 1993.
@inproceedings{BertrandBR93:0,
title = {Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits},
author = {Yves Bertrand and Frédéric Bancel and Michel Renovell},
year = {1993},
tags = {testing},
researchr = {https://researchr.org/publication/BertrandBR93%3A0},
cites = {0},
citedby = {0},
pages = {989-997},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}