Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits - researchr publication

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Yves Bertrand, Frédéric Bancel, Michel Renovell. Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 989-997, IEEE Computer Society, 1993.

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