G. Besnard, X. Garros, François Andrieu, P. Nguyen, W. van den Daele, P. Reynaud, W. Schwarzenbach, D. Delprat, Konstantin Bourdelle, Gilles Reimbold, Sorin Cristoloveanu. Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 226-229, IEEE, 2014. [doi]
Abstract is missing.