Matthias Beyer, Winfried Dulz, Fenhua Zhen. Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 102-105, IEEE Computer Society, 2003. [doi]
@inproceedings{BeyerDZ03,
title = {Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains},
author = {Matthias Beyer and Winfried Dulz and Fenhua Zhen},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510102abs.htm},
tags = {testing, UML, sequence diagrams, Markov},
researchr = {https://researchr.org/publication/BeyerDZ03},
cites = {0},
citedby = {0},
pages = {102-105},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}