Matthias Beyer, Winfried Dulz, Fenhua Zhen. Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 102-105, IEEE Computer Society, 2003. [doi]
Abstract is missing.