Accurate estimation of analog test metrics with extreme circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler. Accurate estimation of analog test metrics with extreme circuits. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 272-275, IEEE, 2012. [doi]

This author has not been identified. Look up 'Kamel Beznia' in GoogleThis author has not been identified. Look up 'Ahcène Bounceur' in GoogleThis author has not been identified. Look up 'Louay Abdallah' in GoogleThis author has not been identified. Look up 'Ke Huang' in GoogleThis author has not been identified. Look up 'Salvador Mir' in GoogleThis author has not been identified. Look up 'Reinhardt Euler' in Google

runs on WebDSL