Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler. Accurate estimation of analog test metrics with extreme circuits. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 272-275, IEEE, 2012. [doi]
@inproceedings{BezniaBAHME12,
title = {Accurate estimation of analog test metrics with extreme circuits},
author = {Kamel Beznia and Ahcène Bounceur and Louay Abdallah and Ke Huang and Salvador Mir and Reinhardt Euler},
year = {2012},
doi = {10.1109/ICECS.2012.6463748},
url = {http://dx.doi.org/10.1109/ICECS.2012.6463748},
researchr = {https://researchr.org/publication/BezniaBAHME12},
cites = {0},
citedby = {0},
pages = {272-275},
booktitle = {19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1259-2},
}