GA based diagnostic test pattern generation for transition faults - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Anupam Bhar, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. GA based diagnostic test pattern generation for transition faults. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-6, IEEE, 2015. [doi]

This author has not been identified. Look up 'Anupam Bhar' in GoogleThis author has not been identified. Look up 'Santanu Chattopadhyay' in GoogleThis author has not been identified. Look up 'Indranil Sengupta' in GoogleThis author has not been identified. Look up 'Rohit Kapur' in Google

runs on WebDSL