Anupam Bhar, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. GA based diagnostic test pattern generation for transition faults. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.