Swapna Bharali, Bijit Choudhuri, Brinda Bhowmick. Investigation of hetero gate oxide hetero stacked triple metal vertical tunnel FET with variable interface trap charges and temperature. Microelectronics Journal, 143:106054, January 2024. [doi]
@article{BharaliCB24, title = {Investigation of hetero gate oxide hetero stacked triple metal vertical tunnel FET with variable interface trap charges and temperature}, author = {Swapna Bharali and Bijit Choudhuri and Brinda Bhowmick}, year = {2024}, month = {January}, doi = {10.1016/j.mejo.2023.106054}, url = {https://doi.org/10.1016/j.mejo.2023.106054}, researchr = {https://researchr.org/publication/BharaliCB24}, cites = {0}, citedby = {0}, journal = {Microelectronics Journal}, volume = {143}, pages = {106054}, }