Investigation of hetero gate oxide hetero stacked triple metal vertical tunnel FET with variable interface trap charges and temperature

Swapna Bharali, Bijit Choudhuri, Brinda Bhowmick. Investigation of hetero gate oxide hetero stacked triple metal vertical tunnel FET with variable interface trap charges and temperature. Microelectronics Journal, 143:106054, January 2024. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.