Predictive Modeling of the NBTI Effect for Reliable Design

Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao, Sarma B. K. Vrudhula. Predictive Modeling of the NBTI Effect for Reliable Design. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 189-192, IEEE, 2006. [doi]

Abstract

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