Mudit Bhargava, Cagla Cakir, Ken Mai. Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS. In 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2012, San Francisco, CA, USA, June 3-4, 2012. pages 25-30, IEEE, 2012. [doi]
Abstract is missing.