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An efficient reliable PUF-based cryptographic key generator in 65nm CMOS

Mudit Bhargava, Ken Mai. An efficient reliable PUF-based cryptographic key generator in 65nm CMOS. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

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