Debesh Bhatta, Ishita Mukhopadhyay, Suriyaprakash Natarajan, Prashant Goteti, Bin Xue. Framework for analog test coverage. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 468-475, IEEE, 2013. [doi]
@inproceedings{BhattaMNGX13,
title = {Framework for analog test coverage},
author = {Debesh Bhatta and Ishita Mukhopadhyay and Suriyaprakash Natarajan and Prashant Goteti and Bin Xue},
year = {2013},
doi = {10.1109/ISQED.2013.6523653},
url = {http://dx.doi.org/10.1109/ISQED.2013.6523653},
researchr = {https://researchr.org/publication/BhattaMNGX13},
cites = {0},
citedby = {0},
pages = {468-475},
booktitle = {International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4951-2},
}