Soumendu Bhattacharya, Abhijit Chatterjee. A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 68-73, IEEE Computer Society, 2004. [doi]
Abstract is missing.