Noise Margins of Threshold Logic Gates containing Resonant Tunneling Diodes - researchr publication authors

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Mayukh Bhattacharya, Pinaki Mazumder. Noise Margins of Threshold Logic Gates containing Resonant Tunneling Diodes. In 8th Great Lakes Symposium on VLSI (GLS-VLSI 98), 19-21 February 1998, Lafayette, LA, USA. pages 65-70, IEEE Computer Society, 1998. [doi]

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