Mayukh Bhattacharya, Pinaki Mazumder. Noise Margins of Threshold Logic Gates containing Resonant Tunneling Diodes. In 8th Great Lakes Symposium on VLSI (GLS-VLSI 98), 19-21 February 1998, Lafayette, LA, USA. pages 65-70, IEEE Computer Society, 1998. [doi]
@inproceedings{BhattacharyaM98,
title = {Noise Margins of Threshold Logic Gates containing Resonant Tunneling Diodes},
author = {Mayukh Bhattacharya and Pinaki Mazumder},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/glsvlsi/1998/8409/00/84090065abs.htm},
tags = {logic},
researchr = {https://researchr.org/publication/BhattacharyaM98},
cites = {0},
citedby = {0},
pages = {65-70},
booktitle = {8th Great Lakes Symposium on VLSI (GLS-VLSI 98), 19-21 February 1998, Lafayette, LA, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8409-7},
}