Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas. An on-line test solution for addressing interconnect shorts in on-chip networks. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 9-12, IEEE, 2016. [doi]
Abstract is missing.