Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Kaushik Roy. Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 453-458, IEEE Computer Society, 2005. [doi]
Abstract is missing.