Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy. Process Variations and Process-Tolerant Design. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 699-704, IEEE Computer Society, 2007. [doi]
@inproceedings{BhuniaMR07, title = {Process Variations and Process-Tolerant Design}, author = {Swarup Bhunia and Saibal Mukhopadhyay and Kaushik Roy}, year = {2007}, doi = {10.1109/VLSID.2007.131}, url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2007.131}, tags = {design}, researchr = {https://researchr.org/publication/BhuniaMR07}, cites = {0}, citedby = {0}, pages = {699-704}, booktitle = {20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-2502-4}, }