Swarup Bhunia, Saibal Mukhopadhyay, Kaushik Roy. Process Variations and Process-Tolerant Design. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 699-704, IEEE Computer Society, 2007. [doi]
Abstract is missing.